EMC Resonance Part II: Decoupling Capacitors
Resonance phenomenon is explained using several common decoupling capacitor configurations.
Evolution of Charged Device Model ESD Target Requirements
Historical Background
CDM is an important model for ESD qualification. The well-known CDM refers to the discharge of an IC package to a grounded surface, whether from automatic handlers in a production area o... Read More...
Banana Skins – March 2021 (#322-329)
We are all aware of TVs and radios being affected by vacuum cleaners, food mixers, mobile phones, and the like...
Requirements of Antennas for EMC Testing
Antennas used for EMC testing possess several characteristics which make them ideal for use in a fast-paced, production-like EMC test environment. This article will briefly describe what these characteristics are, starting with the most important parameter – antenna factor.
The IEC 60601 Amendment Updates Have Published: Changes and Impacts
This article discusses the IEC 60601 Amendments Project, for Medical Electrical Safety, some of the changes to the General and Collateral Standards of the Project, and their impact on manufacturers. The future of the 60601 series of standards is also discussed.
Accessing the Growing Market for Drones in the U.S.
This article examines how the expanded use of commercial drones will impact U.S. regulatory requirements and how the current legislative landscape might change as the market expands.
EMC and Safety for Installations: Part 2
In Part 2 of this two-part article, we’ll discuss the development and use of isolated bonding networks (IBNs).
EMC and Safety for Installations: Part 1
In Part 1 of this two-part article, we’ll discuss the development of “grounding networks” and the shift to meshed structures to reduce damage from overvoltages. Part 2 will appear in our November 2020 issue.
Firmware: The Inexpensive Way to Address EMC Issues
Firmware is integral to the operation of most devices, and may represent an easier and less expensive pathway for addressing EMC issues. This article presents different approaches to modifying firmware as well as case studies illustrating the potential effectiveness of this approach.
Device Failure from the Initial Current Step of a CDM Discharge
CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.