Device Failure from the Initial Current Step of a CDM Discharge

CDM discharges exhibit a fast initial current step when the stray capacitance of the pogo pin is charged. It is demonstrated that the high slew rate can damage sensitive gate oxides. The miscorrelation of CDM and CC-TLP methodologies is addressed by applying pulses with 20 ps rise time.

Why You Should Pay Attention to Cable Discharge Events (CDE)

Cable discharge events occur more frequently than we think, but they often go unrecognized or undiagnosed for root causes, resulting in unnecessary device failures. This article discusses the origins of three types of cable discharge events.

EMI Measurement Receiver Requirements (CISPR 16-1-1)

If you’re performing commercial radiated and conducted emissions measurements strictly by the book, you will want to utilize a measurement receiver or spectrum analyzer that fully complies with CISPR 16-1-1.