September 2018

Out of all of the tools typically found in the Electromagnetic Compatibility (EMC) laboratory...

This part II of the s-parameter tutorial presents several examples of the s-parameter use in EMC measurements and testing.

System level tests on a USB3 controller with on-board protection were found to yield irreproducible failure levels. A root cause analysis was performed using a combination of gun tests, TLP tests, and SEED simulation. It was found that an inductive current distribution between protection and SoC may explain the actual failure levels. Solutions are presented for effective on-board protection of USB3 controller boards.

This article defines ionization qualification and periodic verification test procedures for ionizers which are not addressed in STM3.1 or SP3.3, including air-assist bar ionizers, soft x-ray ionizers, an alternative method of room ionization, and non-airflow alpha ionizers.

This article will discuss risk assessment techniques before and after sale and some of the legal and practical implications arising from their use.

Updates to Past CDM Open Forum Questions

The Banana Skin columns were compiled by Keith Armstrong, of Cherry Clough Consultants Ltd, from items he found in various publications, and anecdotes and links sent in by the many fans of the column.