Digital “Noise” Common-mode Coupling Mechanisms in the Z-Axis

The development of “digital common-mode noise” within circuit devices and subsequently within circuit boards is initially formed by peak over-shoot and under-shoot currents in the power and return planes. The peak currents are attributable to the “cross-conduction” transitions in circuit devices, where the driver literally segments turning “on” before the pull-down drivers turn “off”.

ESD Target Levels: The Industry Council

An Industry Council on ESD Target Levels was established in 2006 when a few IC companies decided to understand why during the product qualification process at every corporation, passing the ESD test is a frequent bottleneck for customer acceptance.


Electrostatic Discharge Technology Roadmap

This document provides estimates of future ESD device thresholds and their potential impact on ESD control practices. The threshold estimates reflect the prevailing trends in semiconductor technology as viewed by selected industry leaders. These projections are intended to provide a view of future device protection limitations driven by performance requirements and technology scaling. It also provides a common view of expected performance for device suppliers and users. Finally, these trends point to the need for continued improvements in ESD control procedures and compliance.

The iNARTE Informer – September 2011

Make the Most of What You Have Unless you have been on another planet, or exploring the upper reaches of the Amazon without radio contact for a few months, you have probably been hanging on to the arms of yo... Read More...

Induction: What it means to ESD

Associate Professor Neils Jonassen authored a bi-monthly static column that appeared in Compliance Engineering Magazine. The series explored charging, ionization, explosions, and other ESD related topics. The E... Read More...