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July 2018

What Every Electronics Engineer Needs to Know About: Simulation Software

Engineers should not overlook modeling and simulation as an important and viable tool in developing products that have to meet EMC compliance requirements.

Reproducibility of CISPR 25 ALSE Test Method

Accredited test laboratories, complying with the requirements of ISO/IEC 17025 have to evaluate measurement uncertainty.

Skin Effect and Surface Currents

Understanding skin effect and surface currents saves us a lot of time and cost in the design of our product’s shielding and filtering, especially for tough EMC standards such as automotive, military or aerospace.

The ANSI-Accredited Standards Committee on EMC – C63®

Many EMC engineers consider the American National Standards Institute (ANSI) C63® Committee on EMC to be the National Committee on EMC for the United States.
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Proper Probe Practice is Paramount in Practical Systems

If someone were to ask you what one singular device is most synonymous with testing, or even electrical engineering, the overwhelming response would most likely be the oscilloscope probe.

EMI Reduction by Spread-Spectrum Frequency Dithering

This article examines the spread-spectrum frequency dithering technique to reduce the EMI noise from a SMPS.

RBW and Overloading in EMI Debugging

Usually the confidence you have in your measurements is directly proportional to the cost of your instrument. Take care.

Charged Board Event (CBE)

Charged Board Event (CBE) is an electrostatic discharge (ESD) event that can occur on assembled printed circuit boards (PCB) and electromechanic assemblies.
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ISO 45001: What It Means for Safety and Risk Communication

In this column, we’ll discuss the International Organization for Standardization’s recently published ISO 45001 standard, its parallels with risk communication on products and its implications for workplace safety.

Banana Skins – July 2018 (#68-78)

We regularly receive requests from readers to publish stories about real EMI/EMC problems faced by real engineers.

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