Over the past few years, the standard RTCA/DO-160, Section 22 has undergone multiple revisions. For those who are new to the requirements, many questions are left unanswered. This article is intended to introduce the requirements of DO-160, Section 22, and to address some of those fundamental questions
In this chapter, Dash makes the modifications to Maxwell’s Equations necessary to encompass the “dynamic” case, that is, where magnetic and electric fields are changing.
This article will provide essential information on the selection and use of the appropriate standards for your products that come within the scope of the EMC Directive 2004/108/EC.
EMI measurements for RF/microwave testing are complex and time-consuming. While signal processing advancements help, key improvements come from enhanced software, integration, automation, and time-domain techniques like FFT, making the EMC measurement process faster and more efficient.
This article addresses the critical question of which method—SVSWR or TDR—more accurately assesses a test site. Given the investments companies make in test sites for EMC compatibility, this is a key assessment question.
Despite the many benefits of using the TDR method for site validation, as an accredited test laboratory we are compelled to also perform site validation measurements using the CISPR 16-1-4 SVSWR method.
The 2003 and 2009 editions of ANSI C63.4 have recently been recognized by the FCC in a Public Notice issued in November for compliance measurements for product certification.
This paper describes how to remove the measurement artifacts caused by discontinuities in high frequency S-parameter data caused by the test connectors on the Printed Circuit Boards (PCBs) and cables. The frequency domain S-parameters are converted to the time domain to get the impulse response. Time domain gating is then used on this impulse response to remove reflections due to end connectors and/or other discontinuities. The gated impulse response is then transformed back to the frequency domain. The final result is a much improved S-parameter data set with unwanted resonance removed, allowing the PCB trace or cable loss to be determined.
This is the first in a series of articles that, instead of focusing on technical aspects of EMC design, engineering, testing, and standards which all of us enjoy reading, I am taking a different approach as a contributing editor to examine in a controversial manner who we are and where our career may possibly take us in the future.
