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February 2018

What Every Electronics Engineer Needs to Know About: ESD Simulators

ESD simulators a.k.a. “ESD Guns” play an important role in product development and their proper selection and use are considered essential to any EMC test laboratory. The focus of this paper is on ESD simulators that perform testing of complete apparatus in accordance with IEC 61000-4-2 and other system level test standards.

Guard Trace Impact on Crosstalk Between PCB Traces

This article discusses the crosstalk reduction between PCB traces by utilizing a guard trace between the traces and investigating the effect of the guard trace grounding.

Verifying the Effect of ElectroMagnetic Noise on an In-Vehicle Ethernet Network

This article describes how the principles of laboratory testing of electrical noise impairment can be followed in the automotive sector to dramatically reduce the manufacturer’s development time and effort.

What to Consider When Integrating In-Vehicle Apps

As more automotive manufacturers integrate mobile platforms and applications into their vehicles, they’ll only get smarter. Or will they?
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Mathematically Defining Test Pulse 2b of the ISO-7637-2 Section 5.6.2 Automotive Test Standard

Automobiles present a very harsh environment for the electrical and electronic devices incorporated into them. Two well-established industry standards that define a wide range of electrical disturbance tests are ISO-7637-2 and ISO-16750-2.

An Overview of Automotive Vehicle and Component Regulations in China

The market for automotive vehicles is growing rapidly in China, especially the market for passenger vehicles. This article provides an overview of the general regulations and new rules that will come into effect.

Harmonics in Clocks Creating EMI Problems

Clock signals from 1 to 100MHz are usually responsible for radiated EMC problems in HF/VHF range. Harmonics are the culprits, but think in current, not in voltage.

Latch-up Qualification

Often (very) fast transients have been proven to trigger latch-up. This kind of latch-up is called transient induced latch-up, commonly known as “transient latch-up” (TLU).
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Banana Skins – February 2018 (#20-27)

We regularly receive requests from readers to publish stories about real EMI/EMC problems faced by real engineers.

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