August 2026

A PMIC that powers every rail correctly on the bench can still fail in the field: brownouts, ignored monitoring features, and broken power-up ordering are common late-stage surprises. Here's the framework for catching them before schematic capture, not after.

Most EMI filter manufacturers validate performance in a clean 50-ohm environment, but real converters rarely operate that way. See what happens to insertion loss when source and load impedance reflect actual operating conditions, and why the gap matters.

Shielding and coating fix MIPI-driven RFI in smartphones, but they come at a cost. This award-winning approach skips the hardware entirely, using firmware alone to steer noise away from sensitive bands, with no added component cost.

Applying back end ESD standards straight into the fab often misses the mark, overcontrolling low risk areas while leaving reticle handling, ionization imbalance, and isolated conductors exposed. Here's why semiconductor fabs need their own ESD guidance document, and how it should work alongside ANSI/ESD S20.20.