This article offers an understanding of what conducted emissions are, their sources and paths, how to measure for them, and how to control them at different stages of design.
Love the technology, but tired of cubicle life? Maybe you should consider becoming a sales engineer.
Learn about the new/revised standards published in the first half of 2017.
Canonical Statistical Model for Maximum Expected Immission of A Wire Conductor in an Aperture Enclosure
Statistical model-based EMC design is evolving for complex electronic networks installed in enclosed spaces typical of spacecraft, aircraft and automobiles.
This article describes the voltage method of the conducted emissions measurements.
There always seem to be questions about hi-pot testing. Maybe I can present some of those questions and their answers.
Transmission Line Pulse Testing: The Indispensable Tool for ESD Characterization of Devices, Circuits and Systems
Transmission Line Pulse testing is the default method for characterizing the behavior of devices under ESD circumstances.
Common mode currents are in the origin of many typical problems in EMI/EMC and RF electronics. The best way to understand those currents is to visualize them in your scope or spectrum analyzer.