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High-Resolution Measurement Instruments for Simultaneous Surface Detail, Contour and 3D Inspection

Taylor HobsonA new series of high-resolution instruments offering automated simultaneous surface and contour inspection has been introduced by Taylor Hobson, a unit of AMETEK Ultra Precision Technologies. The low-noise axes and high-resolution gauge of the Talysurf i-Series instruments assure measurement integrity, and a choice of gauge ranges provides versatility for a variety of applications.

The instruments are available in 1mm, 2mm and 5mm gauge ranges with an 18- bit gauge for improved resolution in surface detail, contour and 3D measurement. Powerful software for analysis of surface finish and form is included.

Ultra-precision machining and FEA (Finite Element Analysis) optimized design combine to provide low-noise and high-accuracy mechanical execution of the measuring axes. Balanced beam design allows the instruments to be used in any orientation. Traceable standards and exclusive algorithms effectively eliminate instrument influence from the measurement results.

- Partner Content -

Signal Analysis Guide

Learn about an analyzer's new features for analyzing phase noise, noise figures, pulses, and Bluetooth signals through firmware upgrades and added applications.

A unique temperature compensation system monitors and feeds back changes in ambient temperature, ensuring consistent system performance and high measurement integrity, regardless of environmental effects

For more information:  www.taylor-hobson.com

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