Langer EMV-Technik GmbH has released their SX near-field probes with a frequency range from 1 GHz to 10 GHz enable EMC analysis of interferences emitted by electronic boards, components and IC pins with high internal frequencies. The SX probe head’s high resolution (SX R3-1 achieves 1 mm and SX E03 covers up to 4 x 4 mm) allows the developer to pinpoint RF sources on densely packed boards or on IC pins. The magnetic-field probe head is electrically shielded. The probes are connected to the input of a spectrum analyser via a shielded cable and SMA connectors during the measurement.
High clock rates of 2 GHz, for example, may result in 5th order harmonics of up to 10 GHz. These harmonics are coupled out by RF sources on the board such as conductor run segments, ICs and other components. They may stimulate other structural parts of the board to oscillate and emit interferences.
The developer can use the SX near-field probes to detect RF sources that oscillate at a frequency of up to 10 GHz on the respective board and take appropriate counter-measures. The practical pin shape of the EMC near-field probes from Langer provides the developer with convenient working conditions.
In view of the high internal base frequencies of current boards, the measurement of harmonic frequency multiples is an important step towards reliable EMC.
For more information, visit www.langer-emv.de.