The E1 immunity development system from Langer-EMV GmbH is an advanced tool that allows electronic developers to perform practical pulsed disturbance immunity measurements (burst/ESD) on modules. The E1 has been specially designed for the development process and helps developer suppress interference in devices/modules or further harden them. It allows the developer to clarify the immediate cause of immunity problems and test the effects of the counter measures directly.
Testing a module’s immunity on the basis of the IEC 61000-4-4 and IEC 61000-4-2 standards is an ideal starting point for hardening the device under test with the E1. The disturbances, generated by the standard burst generator during such a test, are injected into the supply lines of the DUT and flow back to the generator via ground. The paths on which the pulse-shaped disturbances flow through the device module are unknown. An unknown share of these disturbances encounters unknown susceptible equipment in the device and generates a functional fault. The developer does not know if and where the disturbance current with its associated magnetic field induces a voltage pulse in a conductor loop or couples electric field capacitively into susceptible lines. The fault pattern that occurs when a test is performed with standard methods does not reveal precisely where the weak point of the device under test lies. Exact information about the fault pattern that has occurred is the decisive result of a failed compliance test. The developer can then use the E1 at his workplace to analyze the causes of the immunity problems, where the functional faults shown in the fault pattern provide a certain orientation for interference suppression.
The selective injection of disturbance current into individual sections of a device under test (disturbance current paths) and application of pulsed electric (E fields) or magnetic (H fields) fields to selected areas of the module’s surface are crucial for the localization of EMC weak points. While pulsed disturbances are applied to the device under test, the signals can be monitored simultaneously via optical fiber without interaction.
For more information about the EI immunity development system, visit www.langer-emv.com.
