This 3-hour seminar will examine a variety of technologies hitting the market to speed that development and explore solutions for RF Hardware testing to make it all easier. We will cover a wide array of Low Power WAN technologies (LP-WAN) and the tradeoffs for power, range, data throughput, cost, scale and responsiveness. The Classes of devices (A,B & C) will be reviewed. Topics covered include:
- Coexistence Testing
- 802.11af, 802.15.4 (Zigbee), Z-Wave and LoRa
- Narrowband IoT
- It will also include demonstrations using
- Multi-Domain Oscilloscopes to debug IoT circuits
- CMW500/290 RadioCom testers