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Increase Measurement Confidence: 7 Proven Methods

02jun3:00 pm4:00 pmIncrease Measurement Confidence: 7 Proven Methods3:00 pm - 4:00 pm(GMT-04:00) Event Type Webinar

Event Details

Our webinar reviews the electrical measurement challenges associated with some of the most common devices and applications that require testing. We’ll look at the problems associated with the measurement of transistors and various diode types, as well as power management applications and some specialty applications like Laser Diode LIV and battery discharge testing.

We will explore challenges you’ll likely to encounter, including pulse testing to avoid device damage, the thyristor effect, i.e., the “kink” in an I-V curve found in optoelectronic devices, and test synchronization. Following this, we will review instrumentation and the role it can play in reducing or exacerbating measurement challenges. For the applications under review we will show how a source measurement unit (SMU) instrument with its ability to simultaneously source and measure voltage and current offers the potential to increase measurement accuracy and precision and take the place of as many as 5 separate instruments.

By watching this webinar, you will learn:

  • The  key measurement challenges found in today’s most common electrical device types/applications
  • Key issues in addressing those measurement challenges
  • The role of instrumentation selection in addressing those challenges
  • The advantages of using a SMU instrument as an alternative to other instrument types



June 2, 2020 3:00 pm - 4:00 pm(GMT-04:00)



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