Digital Twin of EMI Source – Source Reconstruction Method

Professor Xing – Chang Wei main research interests include near-field scanning, power integrity (PI), and electromagnetic interference (EMI) simulation and testing. He has more than 20 years research experiences of the electromagnetic compatibility (EMC) modeling and design of the high-speed printed circuit boards and packaging. He has authored one book, a book chapter, and about 200 papers published in IEEE Transactions and IEEE international conferences. He received the 2007 Singapore Institution of Engineers Prestigious Engineering Achievement Award for his contribution on the development of the reverberation chamber, and New Century Professional Award from China Ministry of Education in 2010.