The EOS/ESD Association announces the inauguration of 12 individuals from 10 different companies into the DST certification program. The ESD Association is proud to recognize the following certified Device Stress Testing professionals who have completed the program:
- Kenneth Brooks, RFMD
- Thomas Chang, IBM
- Yan Gao, RFMD
- Ephrem Gebreslasie, IBM
- James Goussy, Silicon Laboratories, Inc
- You Li, IBM
- Lin Lin, IBM
- Rahul Mishra IBM
- Bill Reynolds, IBM
- Bill Russell SEMTECH Corp.
- Chris Seguin, IBM
- Pradeep Sharma, Materials Analysis Technology Inc. (MA-Tek)
Device Stress Testing (DST) Certification demonstrates the motivation of companies and individuals to learn state-of-the art techniques and understanding of the latest test standards. Device Stress Testing Certification guarantees current and up to date standards knowledge which will benefit your testing capabilities.
For complete program requirements and registration please visit www.esda.org/DSTcertification.html.
