ESDA Certifies Device Stress Testing Professionals

The EOS/ESD Association announces the inauguration of 12 individuals from 10 different companies into the DST certification program. The ESD Association is proud to recognize the following certified Device Stress Testing professionals who have completed the program:

Kenneth Brooks, RFMD

Thomas Chang, IBM

Yan Gao, RFMD

Ephrem Gebreslasie, IBM

James Goussy, Silicon Laboratories, Inc

You Li, IBM

Lin Lin, IBM

Rahul Mishra IBM

Bill Reynolds, IBM

Bill Russell SEMTECH Corp.

Chris Seguin, IBM

Pradeep Sharma, Materials Analysis Technology Inc. (MA-Tek)

Device Stress Testing (DST) Certification demonstrates the motivation of companies and individuals to learn state-of-the art techniques and understanding of the latest test standards. Device Stress Testing Certification guarantees current and up to date standards knowledge which will benefit your testing capabilities.

For complete program requirements and registration please visit