The EOS/ESD Association announces the inauguration of 12 individuals from 10 different companies into the DST certification program. The ESD Association is proud to recognize the following certified Device Stress Testing professionals who have completed the program:
Kenneth Brooks, RFMD
Thomas Chang, IBM
Yan Gao, RFMD
Ephrem Gebreslasie, IBM
James Goussy, Silicon Laboratories, Inc
You Li, IBM
Lin Lin, IBM
Rahul Mishra IBM
Bill Reynolds, IBM
Bill Russell SEMTECH Corp.
Chris Seguin, IBM
Pradeep Sharma, Materials Analysis Technology Inc. (MA-Tek)
Device Stress Testing (DST) Certification demonstrates the motivation of companies and individuals to learn state-of-the art techniques and understanding of the latest test standards. Device Stress Testing Certification guarantees current and up to date standards knowledge which will benefit your testing capabilities.
For complete program requirements and registration please visit www.esda.org/DSTcertification.html.
