The Electrical Overstress (EOS) / Electrostatic Discharge (ESD) Association, also known as ESD Association, announced the creation of a new EOS Best Practices Task Group that will work to reduce EOS failures through the development of control documents and the dissemination of technical reports.
A team of 25 interested participants from the electronics industry attended the association’s first meeting in February to begin to identify ways to reduce the impact of EOS on manufacturing. Those interested in participating in the EOS Best Practices Task Group should contact the EOS/ESD Association at firstname.lastname@example.org.
EOS/ESD Association members are also scheduled to present EOS tutorials and technical papers at the 2013 Annual EOS/ESD Symposium to be held in Las Vegas, Nevada, Sept. 8-13, 2013. These papers include:
• System Level EOS Case Studies Not Due to Excessive Voltages
• Investigation of Product Burn-In Failures Due to Powered NPN Bipolar Latching of Active MOSFET Rail Clamps
•Using Static Voltage Analysis and Voltage-Aware DRC to Identify EOS and Oxide Breakdown Reliability Issues
EOS is the thermal damage that may occur when an electronic device is subjected to a current or voltage that is beyond the specification limits of the device.