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New Reference Solution for Automotive Electronic Module Test

dashKeysight Technologies, Inc. announced the TS-8989 Body and Safety Electronics Reference Solution, a ready-to-go PXI-based solution for testing body and safety control modules in the automotive electronic test space.

The TS-8989 reference solution includes a chassis that combines an 8-slot PXI chassis, and 11-slot switch/load unit with an integrated 8-ch DIO and &plsmn;12 V fixed DC power supply for fixture control. All of this capability, in a single compact box that will fit into any standard 19-inch rack system, and occupying only 8RU.

Included with the TS-8989 solution is instrumentation and software that will assist customers in reducing the time needed to get their end-of-line functional testing deployed.

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“Understanding the test requirements and challenges of body and safety control modules is critical,” said NK Chari, director of marketing and support for Keysight Technologies’ Measurement Systems Division. “Keysight separates the automotive electronic test into three key areas – stimulus, driving loads and measurement, and we have matched each area with the ideal instruments and software.”

In stimulus, the M9188A PXI, 16-Channel Analog Source or DAC, provides simulation of input sensors, such as force sensors and positions sensors. For simulating discrete switches, such as wiper control switches, Keysight’s U7177A 24-Channel, 2A Load Card has been added into the solution, providing multiple channels of discrete switching; with user-defined loads that engineers can wire to the individual channels.

To simulate driving loads, such as wiper motors or actuating an electro-mechanical component, engineers can select a series of high-current load cards, with a different mix of load channels and handling of currents up to 40 A.

Complementing the solution is Keysight’s M9183A PXI DMM and the N6951A Advance Power System to power up the control module.

The software used is Keysight’s TestExec SL, with support of over 250 routines designed for automotive electronic test to further shorten test development time.

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