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Zhong Chen

Zhong Chen (Member, IEEE) received the M.S.E.E. degree in electromagnetics from The Ohio State University, Columbus, OH, USA, in 1996. He is the Director of Radio Frequency (RF) Engineering at ETS-Lindgren, Cedar Park, TX, USA. He has over 25 years of experience in RF testing, anechoic chamber design, as well as antenna and electromagnetic compatibility (EMC) field probe design and measurements. His research interests include measurement uncertainty, time domain measurements, and development of novel RF absorber materials.,Mr. Chen is currently serving as a Board Member for the Antenna Measurement Techniques Association (AMTA). He is the Chairman of Subcommittee 1 of ANSI ASC C63 which is responsible for EMC antenna calibration and test site validation standards. He is the Chairman of the IEEE Standard 1309 committee responsible for developing calibration standards for field probes and IEEE Standard 1128 for absorber measurements. He served as a Distinguished Lecturer for the IEEE EMC Society.

From This Author

EMC Test Site Qualifications: Site Voltage Standing Wave Ratio versus Time Domain Reflectometry

This article addresses the critical question of which method—SVSWR or TDR—more accurately assesses a test site. Given the investments companies make in test sites for EMC compatibility, this is a key assessment question.

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