Vladimir Kraz

Vladimir Kraz is President and Founder of OnFILTER, a California manufacturer of high-performance U.S.-made EMI filters and instrumentation. Vladimir holds numerous U.S. patents on the subjects of EMI and ESD. He is a leader of EMC Standards Task Force at SEMI, member of ESD Standards Association and an author of many technical papers in publications and International Symposiums.

https://www.onfilter.com

From This Author

Design

System-Level Grounding

Grounding is often viewed from separate points of view - safety, ESD, or EMI. This article combines all these aspects together so that practitioners can address grounding at the factories and in the laboratories in a comprehensive way.

Columns

The Relationship Between EMI/EMC and ESD

The 2020 EOS/ESD Symposium featured a new EMC Special Session, organized in cooperation between the EMC Society and EOS/ESD Association. This Special Session was planned to emphasize the relationship between EMI/EMC and ESD.

Testing

Measurements of Conducted EMI in the Manufacturing Environment

Answering the needs of managing EMI in actual use, this article provides hands-on guidance to specialists at the factories and elsewhere on measuring conducted EMI where it matters – in their environment. Anyone who knows how to use an oscilloscope can perform such measurements.

Manufacturing

Dealing with EMI in Semiconductor Manufacturing: Part II

Enter SEMI E176-1017. It places the focus not on limited types of emission from any particular equipment, but on EMI in the overall manufacturing environment and in key locations where it specifically matters.

Basics

Electromagnetic Compliance: A View from the Field

This article will look at what causes harmful interference and how EMC regulations address them. It will examine three typical and largely encompassing cases that can be extrapolated to many other applications.

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Manufacturing

Dealing with EMI in Semiconductor Device Manufacturing

Semiconductor manufacturing puts special demands on the electromagnetic environment at the factory.

Design

ESD Diagnostics Tools and Methodology

This article focuses on methodology, techniques, and tools to identify, classify, and quantify ESD occurrences in back-end semiconductor and electronics assembly manufacturing.

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Vladimir Kraz

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