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Theresa Lutz

Theresa Lutz received her diploma in physics from the University of Leipzig, Germany, in 2006. After her doctoral studies at the Max Planck Institute of Solid State Research, Stuttgart, Germany, she received her PhD from the EPFL in Lausanne, Switzerland, in 2011. From 2012 to 2017, she worked at Robert Bosch GmbH, Stuttgart, Germany, as a research engineer in the field of technology development of micro-electro-mechanical systems (MEMS). In 2017, she joined Infineon Technologies AG, Munich, Germany, as a development engineer for automotive sensor systems, focusing mainly on ESD and MEMS simulation and modeling.

From This Author

Addressing an Industry Concern: The Demand for a CDM Bare Die Testing Method

Traditional Charged Device Model testing falls short for bare dies in 2.5D/3D devices. With discharge currents reaching 500 mA at just 5V, existing methods can't handle the unique challenges of testing unpackaged components. CCTLP emerges as a promising alternative for reliable low-voltage testing.

Voltage to Current Correlation for CDM Testing

It is now well known that testing for CDM ESD evaluation is becoming a bigger challenge. An alternate approach called capacitively coupled transmission line pulsing (CCTLP) offers advantages over standard field-induced CDM testing.

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