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Shudong Huang

Shudong Huang is a PhD candidate from the ECE department at the University of Illinois at Urbana-Champaign. Advised by Professor Elyse Rosenbaum, Shudong’s primary research interests include CDM-reliable broadband IO circuits, ESD circuit/device design, and compact modeling of ESD devices. He was the recipient of the John Bardeen Fellowship and the John Bardeen Memorial Graduate Research Award at UIUC. He has served as a reviewer for IEEE Transactions on Device and Material Reliability and IEEE Transactions on Electron Devices. He has also served as a technical program committee member for the EOS/ESD Symposium.

From This Author

On-Chip ESD Protection for Multi‑Gbps Automotive Applications

High-speed automotive serial links supporting ADAS features face a critical challenge: meeting stringent system-level ESD requirements while maintaining signal integrity at 10+ Gbps. This column presents an innovative on-chip protection architecture embedding ESD clamps within T-coil circuits, achieving 8kV ISO protection while supporting data rates exceeding 36 Gbps.Retry

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