Lena Zeitlhoefler

Lena Zeitlhoefler received her Master’s degree in Electrical Engineering from the Technical University of Munich (TUM) in 2017. During her Ph.D. studies at TUM, she worked in cooperation with Infineon Technologies AG in the fields of ESD, particularly on the physics of CDM and CDM simulation. She joined the Infineon ESD team in Munich, Germany, full-time in September 2021.

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Addressing an Industry Concern: The Demand for a CDM Bare Die Testing Method

Traditional Charged Device Model testing falls short for bare dies in 2.5D/3D devices. With discharge currents reaching 500 mA at just 5V, existing methods can't handle the unique challenges of testing unpackaged components. CCTLP emerges as a promising alternative for reliable low-voltage testing.

Hot Topics in ESD

Voltage to Current Correlation for CDM Testing

It is now well known that testing for CDM ESD evaluation is becoming a bigger challenge. An alternate approach called capacitively coupled transmission line pulsing (CCTLP) offers advantages over standard field-induced CDM testing.

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Lena Zeitlhoefler

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