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Jeffrey Viel

Mr. Viel is the Chief Engineer, EMI/E3 for Element U.S. Space & Defense and has been with the organization for 26 years. He has over 30 years of equipment and system level EMI/E³ test and analysis experience in the defense and aerospace industries. Mr. Viel is a subject matter expert in the US DoD electromagnetic interference & control requirements for electronic & electrical equipment and systems and provides technical engineering guidance and support to product manufacturers worldwide. Services include EMI/E3 training courses, equipment and system level EMI/E3 design assessments, support of complex EMI/E3 product qualification programs, EMI/E3 testing of high-power equipment and systems, and mobilized/portable EMI/E3 test services. Jeff also specializes in several technical service areas including RADHAZ (HERO, HERP, HERF), EMP, ESD, HPM, EMV, EMI Platform Surveys, Shielding Effectiveness (SE), Lightning effects, external electromagnetic environments (EME), and power quality testing for ships, subs, aircraft, space systems, and land vehicles. Throughout his career, Jeff has supported countless EMI/E3 qualification programs for a wide variety of equipment and systems deployed across every major US DoD platform type (Ship, Submarine, Land, Space, and Air). Jeff Holds B.S. and M.S. degrees in Electrical Engineering from Northeastern University and is a supporting member of several national and international standards committees including the SC135 working group for RTCA DO160 (Environmental Conditions and Test Procedures for Airborne Equipment), SC238 working group for Counter UAS systems, SAE Technical Committee AE-4 (Electromagnetic Compatibility), and the Space ISAC SPD 5 Task Force. He has also published several EMI/EMC/E³ related technical papers over the last two decades.

From This Author

Designing for EMP Resilience

This article provides an overview of high-altitude electromagnetic pulses and the damaging effects they pose to sensitive electronic circuitry, equipment and systems that support a wide range of critical applications, along with common EMP protection approaches and current testing methods used to evaluate the resilience of equipment and systems exposed to an EMP attack.

Electronic Warfare and Cyber Defense of Satellites

With the increasing sophistication of electronic warfare and cyberattacks, it is critical to develop and implement effective cyber defense strategies to ensure the integrity and effectiveness of satellite systems. This article will explore the various test methods and techniques that will be used to protect satellites from electronic warfare and cyberattacks.

Anticipated Changes in MIL-STD-461G

Currently Available Drafts of this Important Standard Reveal Significant Changes For nearly 50 years, MIL‑STD‑461...

Current Harmonics Testing: MIL-STD-1399 Section 300B versus MIL-STD-461F

The extensive use of power electronics on vessels and offshore installations, especially on electric propulsion ships, has had a substantial impact on the power quality of the power distribution system. This article discusses the effects of current harmonic distortion created by commercial uninterruptible power supplies (UPS) being deployed in Naval shipboard applications.

Recent Changes to GR-1089-CORE

Released in May of 2011, GR-1089-CORE Issue 6 Electromagnetic Compatibility (EMC) and Electrical Safety requirements for Network Telecommunications Equipment has undergone a number of technical changes. We look at its substantial modifications and the potential impact on previously certified products.

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Testing for Immunity to EMP

The 21st century as we know it, truly reflects the age of technology. Every aspect of life today is encompassed by the use of some sort of microprocessor based electronics intended to simplify tasks, to improve processes, and improve efficiency. Electronics are used to communicate with loved ones, manage finances, fly aircraft, even save lives. As greater advances in technology are achieved, electronics are found controlling more important safety critical functions at an exponential rate. Although electronics have provided us with obvious benefits, the increasing reliability on electronics has elevated our vulnerability to the effects electromagnetic pulses.

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