Jay Diepenbrock

Joseph C. (Jay) Diepenbrock received the Sc. B. and M. S. degrees in electrical engineering from Brown University, Providence, RI, and Syracuse University, Syracuse, NY, respectively. Mr. Diepenbrock has worked in a number of areas in IBM including bipolar and CMOS IC design, analog and digital circuit design, backplane design and simulation, and network hardware and server product development. He is currently a Senior Technical Staff Member in the Interconnect Qualification Engineering department in IBM’s Integrated Supply Chain, working on the electrical testing and modeling of connectors and cables.

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Printed Circuit Boards

S-parameter Data Correction Using Time Domain Gating for PCB and Cable Applications

This paper describes how to remove the measurement artifacts caused by discontinuities in high frequency S-parameter data caused by the test connectors on the Printed Circuit Boards (PCBs) and cables. The frequency domain S-parameters are converted to the time domain to get the impulse response. Time domain gating is then used on this impulse response to remove reflections due to end connectors and/or other discontinuities. The gated impulse response is then transformed back to the frequency domain. The final result is a much improved S-parameter data set with unwanted resonance removed, allowing the PCB trace or cable loss to be determined.

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