Jian Liu

In 2011, Dr. Liu joined the ESD group of RF Micro Devices (RFMD, now Qorvo), where he is working as a staff device engineer on the CMOS ESD protection design. Dr. Liu is an IEEE peer reviewer and has published over 40 technical papers for conferences and in journals. He has been a member of ESDA since 2012.

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Modeling the RF Switch Front End Module ESD Protection

The article discusses ESD protection challenges for RF switches in SOI technology. It examines the self-protection mechanism, proposes a behavioral model to simulate ESD response more accurately, and explores predicting failure current levels critical for reliable ESD design.

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