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Friedrich zur Nieden

Friedrich zur Nieden received a Ph.D. degree in Electrical Engineering from the TU Dortmund University, Germany, in 2014. From 2007 to 2012, he was a research and teaching assistant at the On-board Systems Laboratory at the TU Dortmund University. In 2010, he received a scholarship from the German Academic Exchange Service, staying at Missouri University of Science and Technology, Rolla, USA, where he continued his work in the field of system-level ESD simulation. In 2012 he joined the team of the central ESD department with Infineon Technologies AG, Munich, Germany. At Infineon, he works on ESD topics with a focus on characterization, device testing, ESD on system level, and production support.

From This Author

Addressing an Industry Concern: The Demand for a CDM Bare Die Testing Method

Traditional Charged Device Model testing falls short for bare dies in 2.5D/3D devices. With discharge currents reaching 500 mA at just 5V, existing methods can't handle the unique challenges of testing unpackaged components. CCTLP emerges as a promising alternative for reliable low-voltage testing.

Voltage to Current Correlation for CDM Testing

It is now well known that testing for CDM ESD evaluation is becoming a bigger challenge. An alternate approach called capacitively coupled transmission line pulsing (CCTLP) offers advantages over standard field-induced CDM testing.

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