EOS/ESD Association, Inc.

Founded in 1982, EOS/ESD Association, Inc. is a not for profit, professional organization, dedicated to education and furthering the technology Electrostatic Discharge (ESD) control and prevention. EOS/ESD Association, Inc. sponsors educational programs, develops ESD control and measurement standards, holds international technical symposiums, workshops, tutorials, and foster the exchange of technical information among its members and others.

https://www.esda.org

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Hot Topics in ESD

The Impact on ESD Risk of AI on Silicon Fabrication and the Implications of Increasing Memory Stacks

This column explores the significant impact of artificial intelligence on advancements in silicon fabrication, focusing on the development of high bandwidth memory (HBM) and associated die-to-die(D2D) electrostatic discharge (ESD) protection challenges.

Hot Topics in ESD

Machine Learning Applications in the Novel ESD Compact Modeling Methodology

This column explores the application of machine learning techniques in ESD compact modeling for semiconductor devices. It compares traditional methods with a new machine learning approach, highlighting improved efficiency and accuracy in predicting ESD protection performance.

Hot Topics in ESD

Are ESD & ESA Controls in place in Semiconductor Wafer Fabs?

This text discusses ESD/ESA control in semiconductor fabs, highlighting challenges with S20.20 certification, the importance of grounding conductive materials, managing insulative materials, and using ionization for charge neutralization in wafer manufacturing processes.

Hot Topics in ESD

What’s New in ESD Control Standards?

Standards continuously evolve, and EOS/ESD Association, Inc. standards are no different. The ESDA is always striving to achieve the highest quality standards.

Hot Topics in ESD

Does An ESD Control Program Require Humidity Controls?

Humidity control in relation to an ESD control program continues to be misunderstood across the industry. Humidity does help in the reduction of charge accumulation, but it does not control charge accumulation to reduce the risk to sensitive items.

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The ESD Association Technology Roadmap

The ESDA technology roadmap is written to support and guide the daily work of ESD and latch-up experts in the worldwide industry and academia.

Charged Device Model

Challenges of CDM Modeling for High-Speed Interface Devices

The behavior of ultra-high-speed interfaces is complex, involving fast-rise time waveforms and on-die transient phenomena that cause device failure at lower CDM levels.

Columns

Implementing Embedded ESD Detection, Part 2

This column focuses on the practical aspects of implementing embedded ESD detection. We’ll provide a step-by-step guide, discuss validation and testing methodologies, present case studies, and delve into future trends and innovations in the field.

Columns

Understanding Embedded On-Chip ESD Detection, Part 1

ESD “event detectors” have been used for years in factory environments to identify and remediate ESD discharges during manufacturing. Now design engineers are embedding system-level and on-chip ESD detection technologies into their systems to analyze and recover from both factory and field ESD events.

Columns

CDE Modeling Using Star-Tree Impedance Networks for USB2 Cable

Simple star-tree networks, as shown here for USB2, should have wide applicability for cables carrying fast signals.

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