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Min Zhang

Dr. Min Zhang is the founder and principal EMC consultant of Mach One Design Ltd, a UK-based engineering firm that specializes in EMC consulting, troubleshooting, and training. His in-depth knowledge in power electronics, digital electronics, electric machines, and product design has benefitted companies worldwide.

From This Author

Using Near-Field Probes to Troubleshoot Radiated Immunity Failures

This Column discusses a technique for troubleshooting radiated immunity failures in electronic devices using near-field probes. It presents a case study, explains the method's application, and addresses its limitations and safety considerations for bench-level testing.

Filter Designs for Switched Power Converters − Part 1: Overview

This series of articles delves into the design principles of power filters for switched-mode power converters and similar applications, focusing on conducted and radiated emissions. Part 1 provides an overview of filter design principles, emphasizing the need for specialized approaches to meet EMC specifications in an increasingly electrified and sustainable world.

Using Reciprocity Theorem to Troubleshoot Immunity Issues

This article discusses using the reciprocity theorem in EMC troubleshooting, particularly for immunity issues. It describes a case study involving a smart meter and demonstrates how emission measurements can help identify susceptibility problems, highlighting the usefulness of walkie-talkies in testing.

Using RF Monitoring Probes to Troubleshoot Transient Failures

In large systems, such as big cabinets housing numerous electronic components, employing the near-field probe method can be time-consuming and, depending on the voltage level, potentially unsafe (for instance, when dealing with high-voltage circuits requiring isolation). In such scenarios, an alternative approach is necessary.

Using a Near-Field Probe to Troubleshoot Transient Failures

Solving EMI problems isn’t only about ensuring that a product can meet EMC regulations and standards (although it’s a significant part of the job). Another crucial reason for addressing EMI issues is to enhance product reliability, especially when a product operates in public or industrial areas where there are many different types of noise sources.
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Setting Up a Benchtop Conducted Emission Test

Conducted emission tests can provide reasonably accurate results and also serve as a reliable indicator of radiated emissions, as some of these emissions propagate through cable wiring.

GaN/SiC Transistors for Your Next Design: Fight or Flight?

This article offers some useful insights and guidelines on how to effectively design and test systems using wide band gap devices to optimize product performance and achieve EMC compliance.

Locating the Noise Source of the 10-30 MHz “Hump”

During conducted emission tests, one of the challenges manufacturers face is the resonance peaks in the harmonic noise somewhere between 10 MHz and 30 MHz. Often, no amount of filtering will eradicate or attenuate the peak.

In-Situ Radiated Emission Testing of Large Systems Installations

When it comes to in-situ radiated emission measurements, the combination of near- and far-field measurements is often the best approach.

Four Useful Tips for Using Affordable Benchtop Spectrum Analyzers

In this column, we discuss several important features of a spectrum analyzer not covered in previous articles that are worth your consideration.
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