Kathleen Muhonen is currently a Principal Development Engineer at Qorvo in Greensboro, NC. She is responsible for developing ESD (electrostatic discharge) on-chip protection for mobile and millimeter wave applications. She is also involved with system level testing and helped standardize IEC testing of RF components. She is heavily involved in ESD instrumentation for better ESD characterization of clamps and materials. Previously she was responsible for RF characterization and model support for Silicon and Gallium Arsenide technologies for power amplifiers, switches and antenna tuners. She has also done extensive work on developing state of the art harmonic characterization of semiconductors, breakdown characterization of RF switches and improved de-embedding techniques of large scale switches. Kathleen's previous experience includes assistant professor at Penn State Erie, linearization design for base stations at Hewlett Packard, millimeter wave power amplifier design at Lockheed Martin and GE Aerospace.
Kathleen has served as a member of the ESD Association and sits on all device testing standards committees, including serving as past TLP (Transmission Line Pulsing) and HMM (Human Metal Model) workgroup chairs. She has also served on the Board of Directors and now serves on the Education Committee. Her involvement in round robin testing for TLP, VF-TLP (very fast TLP) and IEC (International Electrotechnical Commission) Component Testing has generated several papers presented at the EOS/ESD Symposium over the last decade.
Kathleen received her BSEE degree from Michigan Technological University in 91, a MSEE from Syracuse University in 94, and a Ph.D.EE from Penn State University in 99.
