Scott Mee

Scott Mee is a co-founder and owner at E3 Compliance which specializes in EMC & SIPI design, simulation, pre-compliance testing and diagnostics. He has published and presented numerous articles and papers on EMC. He is an iNARTE certified EMC Engineer and Master EMC Design Engineer. Scott participates in the industrial collaboration with GVSU at the EMC Center.

From This Author

Plane Wave Shielding: Impact of the Conducting Shield on the Electric and Magnetic Fields

Why does a solid metal enclosure block an incoming wave almost completely, yet still let a sliver of energy through? This installment of EMC Concepts Explained walks through the reflection and transmission math at both shield interfaces, showing exactly why thickness and conductivity make all the difference.

Shielding Effectiveness: The Impact of Loss Tangent on the Reflection and Absorption Losses

Before you can calculate shielding effectiveness, you need to know whether your material qualifies as a good conductor — and that's where loss tangent comes in. This deep dive connects the math to the physics, from plane wave propagation to practical near- and far-field shielding formulas.

Impact of PCB Via and Trace Geometry on the Effectiveness of Decoupling Capacitors, Part 3

Via placement and trace geometry significantly affect decoupling capacitor performance. This final installment of a three-part series presents conducted emissions measurements across six PCB via topologies, revealing how distance from the power-ground plane pair and via spacing impact EMC results.

Impact of PCB Via and Trace Geometry on the Effectiveness of Decoupling Capacitors, Part 2

Conducted emissions testing on custom PCBs shows how moving a decoupling capacitor farther from an IC can increase emissions across multiple frequency bands. Using CISPR 25 methods, this study compares capacitor placements and via topologies to reveal how distance and inductance shape PDN behavior.

Impact of PCB Via and Trace Geometry on the Effectiveness of Decoupling Capacitors, Part 1

Explore how PCB via and trace geometry influence the real‑world effectiveness of decoupling capacitors. This first article in the series defines six board variants, capacitor placement strategies, and PCB topologies, setting the stage for upcoming RF emission results based on CISPR 25 testing.
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Return-Current Distribution in a PCB Microstrip Line Configuration, Part 2

This is the second article of a two-article series devoted to the return current distribution in a PCB microstrip line configuration.

Return-Current Distribution in a PCB Microstrip Line Configuration, Part 1

This is the first article of a two-article series devoted to the return current distribution in a 2-layer FR-4 PCB microstrip line configuration with a solid reference plane.

Evaluation of PCB Design Options on Analog Signal RF Immunity using a Multilayer PCB

This month’s column is the last of three parts devoted to designing, testing, and EMC immunity evaluation of multilayer PCBs containing analog circuitry.

Evaluation of PCB Design Options on Analog Signal RF Immunity using a Multilayer PCB

This is the second of three articles devoted to the design, test, and EMC immunity evaluation of multilayer PCBs containing analog circuitry.
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