Timothy Maloney

Timothy J. Maloney is a Fellow of the IEEE and the co-author of the book, Basic ESD and I/O Design (Wiley, 1998). He spent much of his 40-plus-year career as a Senior Principal Engineer at Intel Corporation.

From This Author

Testing

Basing CDM ESD Test Goals on Fundamental Limits

Setting CDM test goals has long lacked clear guidance on what counts as adequate performance. New analysis grounded in radial transmission line theory calculates fundamental limits on peak current and slew rate for devices of any size, offering engineers a way to evaluate risk against real use conditions.

ESD Standards

A Circuit Model for the Charged Device Model Spark

The charged device model spark itself is not just resistive; it often has extra inductance or L-C energy storage. These plus hardware properties affect the CDM waveform and affect methods to correlate alternate CDM test methods to standard JEDEC CDM.

Columns

CDE Modeling Using Star-Tree Impedance Networks for USB2 Cable

Simple star-tree networks, as shown here for USB2, should have wide applicability for cables carrying fast signals.

ESD Control

Ohm’s Law Also Applies to ESD‑Induced Heat Pulses

Heat flow analysis for semiconductor ESD situations can be approximated to one dimension, and then captured with a generalized Ohm’s Law using a complex impedance. Methods can include time-dependent electrothermal pulses and feedback due to self-heating, with solutions readily carried out on any desktop computer.

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Timothy Maloney

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