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Author Hans Kunz

Hans Kunz

Hans Kunz

Hans Kunz is a distinguished member of the technical staff at Texas Instruments, with 25+ years of experience in the development and application of on-chip ESD protection for analog designs. He is a frequent contributor to ESDA activities, including technical program committees, tutorials, workshops, and presentations for the IEW and the EOS/ESD Symposium.

Challenges of Designing System-Level ESD Protection at the IC-Level

There is often confusion about the interaction between IC-level component ESD protection and the appropriately required system-level ESD protection strategy.

Impact from IC On-Chip Protection Design on EOS

Robust ESD protection does not ensure that IC designs are protected from unintended EOS effects. This article identifies areas of risk in some ESD design methods.

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