Hans Kunz, Author at In Compliance Magazine

ESD Designers’ Headache with Multiple Automotive Test Requirements, Part 2

The trend of progressively migrating both ESD and EMC immunity from the system/board to the component level is creating unprecedented challenges for the component ESD designer. Implications of EMC-ESD immunity co-design will be reviewed along with several case studies.

Challenges of Designing System-level ESD Protection at the IC Level, Part 2

It is a common misconception that designing an IC for system-level ESD requirements simply requires an increase in the capability of the ESD cells, which are already present for safe handling ESD requirements, like Human Body Model (HBM).

Challenges of Designing System-Level ESD Protection at the IC-Level

There is often confusion about the interaction between IC-level component ESD protection and the appropriately required system-level ESD protection strategy.

Impact from IC On-Chip Protection Design on EOS

Robust ESD protection does not ensure that IC designs are protected from unintended EOS effects. This article identifies areas of risk in some ESD design methods.

Decoding the Invention of the Radio

Individuals in Engineering and Technology Recognized for STEM Achievements & Community Contributions

U.S. DoE to Provide Nearly $3 Billion for EV Battery Development, Manufacturing

Wirelessly Powering IoT With 5G Network

Polymer Film Can Limit Electromagnetic Interference

New Transformer Turns Ratio Measuring Instrument

FCC Levies $6 Million Plus in Fines for Three Pirate Radio Operations

FCC Issues Proposed Rules to Prevent Digital Discrimination

FCC Launches Inquiry Into AI-Based Robocalls/Texts

Capacitors: Theory and Application

ESD Co-Design for High-Speed SerDes in FinFET Technologies

GaN/SiC Transistors for Your Next Design: Fight or Flight?

Local PCB Layout Tweaks for Improved Signal Integrity When Using ESD Protection Devices

Clock Duty Cycle Tuning for Desense Mitigation in Modulation‑Involved Cases

ESD Designers’ Headache with Multiple Automotive Test Requirements, Part I

Troubleshooting EMI Issues Caused by Structural Resonances

Electromagnetic Simulation Applied to Automotive EMC Testing

Measurement Uncertainties in Outdoor Far-Field Antenna Ranges

IT Server Hardware Compliance, Part 1

ESD Designers’ Headache with Multiple Automotive Test Requirements, Part 2

GaN/SiC Transistors for Your Next Design: Fight or Flight?

(Re)Discovering the Lost Science of Near-Field Measurements, Part 4

(Re)Discovering the Lost Science of Near-Field Measurements, Part 3

CENELEC Publishes EN 61189-3-719:2016, Standard for Test Methods for Electrical Materials

ANSC C63 Committee on EMC: A 2023 Status Report

An Overview of Aerospace Battery Compliance

The Future of Wi-Fi

Effective Product Safety Labels: Your Guide to Symbols

NASA Space Shuttle’s Return to Flight: The Untold Electromagnetic Backstory

Continuing Your Professional Education in 2022

A Recipe for Success: How to Grow from EMC Novice to EMC Expert

Capacitors: Theory and Application

Ohm’s Law Also Applies to ESD‑Induced Heat Pulses

RF Tech Tip: BNC Versus Threaded Connectors

Hans Kunz

ESD Designers’ Headache with Multiple Automotive Test Requirements, Part 2

Challenges of Designing System-level ESD Protection at the IC Level, Part 2

Challenges of Designing System-Level ESD Protection at the IC-Level

Impact from IC On-Chip Protection Design on EOS

Author Hans Kunz