Hans Kunz

Hans Kunz is a distinguished member of the technical staff at Texas Instruments, with 25+ years of experience in the development and application of on-chip ESD protection for analog designs. He is a frequent contributor to ESDA activities, including technical program committees, tutorials, workshops, and presentations for the IEW and the EOS/ESD Symposium.

From This Author

Automotive

ESD Designers’ Headache with Multiple Automotive Test Requirements, Part 2

The trend of progressively migrating both ESD and EMC immunity from the system/board to the component level is creating unprecedented challenges for the component ESD designer.

Columns

Challenges of Designing System-level ESD Protection at the IC Level, Part 2

It is a common misconception that designing an IC for system-level ESD requirements simply requires an increase in the capability of the ESD cells, which are already present for safe handling ESD requirements, like Human Body Model (HBM).

Columns

Challenges of Designing System-Level ESD Protection at the IC-Level

There is often confusion about the interaction between IC-level component ESD protection and the appropriately required system-level ESD protection strategy.

Design

Impact from IC On-Chip Protection Design on EOS

Robust ESD protection does not ensure that IC designs are protected from unintended EOS effects. This article identifies areas of risk in some ESD design methods.

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Hans Kunz

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High Intensity Radiated Fields (HIRF), Part 4

FCC Issues Limited Delay in TCPA Implementation

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FDA Struggles to Meet Product Review Deadlines

Design and Operation of Antennas