Charvaka Duvvury

Charvaka Duvvury is a fellow of the IEEE and works as a technical consultant on ESD design methods and ESD qualification support.

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Columns

The Many Aspects of Semiconductor Reliability with Impact on ESD Design

Reliability issues need to be continuously addressed during technology development as technologies further advance into novel transistor structures such as FinFETs and Multi-gate devices.

Charged Device Model

Evolution of Charged Device Model ESD Target Requirements

Historical Background CDM is an important model for ESD qualification. The well-known CDM refers to...

Design

Impact from IC On-Chip Protection Design on EOS

Robust ESD protection does not ensure that IC designs are protected from unintended EOS effects. This article identifies areas of risk in some ESD design methods.

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Charvaka Duvvury

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