Jeffrey C. Dunnihoo

Jeffrey Dunnihoo is the founder of Pragma Design in 1997, specializing in interface design architecture and ESD, EOS, and other transient analysis technologies. He has presented at IEEE EMC Society, the EOS/ESD Association, and ISTFA, and has co-authored a new textbook with other ESD experts on ESD co-design fundamentals, as well as a children’s book series on technology and microelectronics. He has also been a contributor to industry groups and standards bodies, such as USB, IEEE 802.11, VESA/DisplayPort, ESD Industry Council, and has served on ESDA working groups.

From This Author

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Integrating Embedded ESD Detection, Part 3

This column outlines the steps to consider when embedding ESD detection capabilities into your system and overall design flow.

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Implementing Embedded ESD Detection, Part 2

This column focuses on the practical aspects of implementing embedded ESD detection. We’ll provide a step-by-step guide, discuss validation and testing methodologies, present case studies, and delve into future trends and innovations in the field.

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Understanding Embedded On-Chip ESD Detection, Part 1

ESD “event detectors” have been used for years in factory environments to identify and remediate ESD discharges during manufacturing. Now design engineers are embedding system-level and on-chip ESD detection technologies into their systems to analyze and recover from both factory and field ESD events.

International Electrotechnical Commission (IEC)

IEC 61000-4-2 Emulation and Simulation

ESD qualification requirements for systems rely heavily on discharge models such as IEC61000-4-2.

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Jeffrey C. Dunnihoo

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What's New

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