Ashok Alagappan

Ashok Alagappan has over 15 years of experience in the Semiconductor industry, specializing in design and manufacturing of semiconductor products. He has managed products through their life cycle, from introduction in the Fab to qualification. At Ansys, he is working with customers across the spectrum, from aerospace to automotive to commercial, providing expert analysis and solutions for defining and improving reliability of electronic products and Integrated Circuit (IC) components. He has developed an IC wear out tool to predict the lifetime characteristics of IC components in high reliability applications like aerospace, defense, automotive, among others. He has built models to characterize the intrinsic wear out failure mechanisms of ICs and has implemented the tool in the Ansys Sherlock ADA™ software product.

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The Dilemma Between Customers and Suppliers on EOS Failures

During the last four decades, damage to devices from electrical overstress (EOS) has confounded both IC suppliers and customers. The Industry Council on ESD Target Levels investigated numerous EOS root causes and established a white paper on the subject, JEP174 [1].

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