Theo Smedes

Theo Smedes began work in ESD in 2000 and is currently Fellow for ESD, Latch-up, and EOS within NXP Semiconductors. He published several papers on ESD and introduced an ESD design course within NXP. Theo is a member of all ESDA device testing working groups and is chair of the TLP working group. He has been a member of the Industry Council on ESD Target Levels since it was founded in 2006.

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Industry Council’s Latch‑up Survey

This article provides a high-level overview of the Industry Council paper “Survey on Latch‑up Testing Practices and Recommendations for Improvements,” which describes the full analysis of the collected responses and lays a path for potential adaptations needed to accommodate its use in future technologies and applications.

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Transmission Line Pulse Testing: The Indispensable Tool for ESD Characterization of Devices, Circuits and Systems

Discover how engineers test electronic device resilience using Transmission Line Pulse testing, uncovering the critical science that protects our most sensitive technologies from catastrophic electrical failures.

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Theo Smedes

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FDA Struggles to Meet Product Review Deadlines

Design and Operation of Antennas

FDA Warns Against Unauthorized Modifications to Medical Devices

ESD Testing Parameters

FDA Alerts the Medical Device Industry About Unreliable Third-Party Test Data