Theo Smedes

Theo Smedes began work in ESD in 2000 and is currently Fellow for ESD, Latch-up, and EOS within NXP Semiconductors. He published several papers on ESD and introduced an ESD design course within NXP. Theo is a member of all ESDA device testing working groups and is chair of the TLP working group. He has been a member of the Industry Council on ESD Target Levels since it was founded in 2006.

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Industry Council’s Latch‑up Survey

This article provides a high-level overview of the Industry Council paper “Survey on Latch‑up Testing Practices and Recommendations for Improvements,” which describes the full analysis of the collected responses and lays a path for potential adaptations needed to accommodate its use in future technologies and applications.

Columns

Transmission Line Pulse Testing: The Indispensable Tool for ESD Characterization of Devices, Circuits and Systems

Transmission Line Pulse testing is the default method for characterizing the behavior of devices under ESD circumstances.

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Theo Smedes

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