Kenneth Wyatt

Kenneth Wyatt, Sr. EMC Engineer, Wyatt Technical Services LLC, holds degrees in biology and electronic engineering and has worked as a senior EMC engineer for Hewlett-Packard and Agilent Technologies for 21 years. He also worked as a product development engineer for 10 years at various aerospace firms on projects ranging from DC-DC power converters to RF and microwave systems for shipboard and space systems. A prolific author and presenter, he has written or presented topics including RF amplifier design, RF network analysis software, EMC design of products and use of harmonic comb generators for predicting shielding effectiveness. He has been published in magazines such as RF Design, Test & Measurement World, Electronic Design, Microwave Journal, Interference Technology, HP Journal, and several others. Kenneth is a senior member of the IEEE and a long time member of the EMC Society where he serves as their official photographer. He is also a member of the dB Society and is a licensed amateur radio operator. His comprehensive yet practical EMC design, measurement, and troubleshooting seminars have been presented across the U.S., Europe, and Asia.

From This Author

EMC Bench Notes: Troubleshooting with a Nearby Antenna

A simple antenna positioned right on your bench can reveal radiated emissions in real time. Learn how to separate product harmonics from ambient RF noise, track down capacitive and inductive coupling paths, and use copper tape and foil to hunt down leaky seams and apertures.

EMC Bench Notes: Interpreting Emissions Using a Near-Field Probe

Not all EMC emissions look alike — and knowing the difference can save your compliance test. Kenneth Wyatt breaks down how to use near-field probes to identify and interpret broadband versus narrowband emission profiles, so you can trace noise back to its source before it becomes a costly failure.

EMC Bench Notes: Embedded Processor Characterization and Design Review

An Arduino-based board with no solid ground return plane makes the perfect "what not to do" test case. Near-field probe measurements, spectrum analyzer captures, and real emissions data reveal why two-layer designs can be EMC trouble — and what it takes to fix them.

EMC Bench Notes: How to Use Spectrum Analyzers for EMC

Spectrum analyzers are the go-to tool for diagnosing conducted and radiated emissions — but knowing how to configure them makes all the difference. Kenneth Wyatt walks through key settings, trace strategies, and practical tips for getting reliable results on the bench.

EMC Bench Notes: Some Starting Tools

Tackle radiated emissions before heading to the test lab. This practical guide covers the essential workbench toolkit — near field probes, RF current probes, and spectrum analyzers — including DIY options and affordable commercial choices for identifying noise sources and reducing cable emissions.
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Just Starting Out In EMC?

Learn the essentials of EMC troubleshooting for product designers with this introductory column from Kenneth Wyatt. It explains why EMC failures derail product launches, highlights core design challenges, and offers foundational resources to help engineers start diagnosing emissions and immunity issues directly on the bench.

Troubleshooting EFT, Part 1

Electrically fast transient (EFT/B) testing simulates switching and motor-induced transients that can disrupt electronic systems. This article explains the fundamentals of EFT immunity, outlines practical benchtop testing alternatives, and provides step-by-step guidance for identifying and resolving EFT susceptibility before formal compliance testing.

Harmonic Comb Generators

Harmonic comb generators are essential EMC lab tools that produce harmonically-related signals for chamber verification and troubleshooting. Learn why every test lab needs one, how to build a simple DIY version for under $50, and discover the best commercial options with unique features. From measuring cable resonances to portable chamber validation, these versatile devices belong in every EMC engineer's toolkit.

Case Study: Point of Sale Terminal ESD

Field failures traced to ESD-induced USB hub damage in deployed POS terminals. Through systematic H-field probe analysis, we identified poor connector-to-chassis bonding as the root cause—a preventable design oversight with expensive retrofit implications.

Understanding and Dealing with ESD

ESD failures are increasing as products shrink and use lower voltages with smaller noise margins. Learn how to trace ESD current paths using H-field probes and oscilloscopes to quickly identify where discharge energy flows, enabling targeted fixes like bonding and shielding to solve immunity problems efficiently.
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