Get our free email newsletter

Agilent Technologies Introduces Industry’s Most Accurate Test Solution for USB 3.1 Receivers

Agilent Technologies Inc. announced the industry’s most accurate test solution for characterizing USB 3.1 receivers. Using the Agilent USB 3.1 receiver test set, design and test engineers in the semiconductor and computer industry can now accurately characterize and verify USB 3.1 receiver ports in ASICs and chipsets.

USB interfaces are commonly used in today’s PCs, tablets, mobile phones and external storage devices. The new USB 3.1 specification was released by the USB Implementers Forum in 2013, and the first USB 3.1 10-Gb/s-capable products are expected to reach the market in 2014. The USB 3.1 specification more than doubles possible throughput compared with the USB 3.0 specification. This throughput improvement was achieved by doubling the physical data rate from 5 to 10 Gb/s and by changing the coding scheme from 8-bit/10-bit to 128-bit/132-bit, which requires significantly less overhead.

R&D and test engineers who design and test USB 3.1 chipsets are facing new challenges. For receiver test, the doubled physical data rate means the margins for signal integrity are tighter. To ensure proper operation, the receiver must tolerate a mix of different jitter types. Three-tap de-emphasis is required to compensate for the losses of the channel. And finally, the analyzer must be able to filter 128-bit/132-bit coded skip-ordered sets with variable length during error counting.

- Partner Content -

A Dash of Maxwell’s: A Maxwell’s Equations Primer – Part One

Solving Maxwell’s Equations for real-life situations, like predicting the RF emissions from a cell tower, requires more mathematical horsepower than any individual mind can muster. These equations don’t give the scientist or engineer just insight, they are literally the answer to everything RF.

Benefits of the Agilent USB 3.1 receiver test solution include:

• accurate and repeatable receiver test results enabled by J-BERT’s built-in and calibrated jitter sources and intersymbol interference (ISI) traces;

• precise emulation of pre- and post-cursor de-emphasis;

• built-in clock recovery to reduce setup complexity;

• error counting accomplished by real-time filtering of the USB 3.1-specific 128-bit/132-bit coded skip-ordered sets (that can vary in length from the pattern stream); and

- From Our Sponsors -

• investment protection enabled by using Agilent instruments that can be repurposed for accurate characterization in multiple gigabit test applications, such as PCIe®, SATA, DisplayPort and others.

The Agilent USB 3.1 receiver test solution consists of either:

• the enhanced J-BERT N4903B high-performance serial 12.5-Gb/s BERT with its integrated jitter sources and ISI and the N4916B de-emphasis signal generator; or

• the J-BERT M8020A high-performance 16-Gb/s BERT with integrated and calibrated jitter sources (random jitter, period jitter, SSC), 8-tap de-emphasis and M8048A ISI channels.

More information about Agilent’s USB 3 receiver test solutions is available at www.agilent.com/find/usb3_receiver_test

Related Articles

Digital Sponsors

Become a Sponsor

Discover new products, review technical whitepapers, read the latest compliance news, trending engineering news, and weekly recall alerts.

Get our email updates

What's New

- From Our Sponsors -

Sign up for the In Compliance Email Newsletter

Discover new products, review technical whitepapers, read the latest compliance news, trending engineering news, and weekly recall alerts.