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Aeroflex Demonstrates Breadth of Production Test Capability at Productronica 2013

Aeroflex Limited announced that its booth at this year’s Productronica show in Munich will feature its strongest ever line-up of automatic test equipment (ATE) and PXI modular instrumentation, as well as flexible stand-alone signal generators and signal analyzers.

The product offering includes a new form-factor ATE system; the latest wide-bandwidth 5th Generation PXI modules; WLAN802.11p functionality; PXI Maestro software for lower cost wireless device production test; and the Aeroflex S-Series signal generators and signal analyzers.

Aeroflex’s latest addition to the 5800 Series Multi-Strategy Test System range combines analogue in-circuit test and functional test capabilities in a new upright form factor. The new system combines an operator’s panel and larger cabinet space for additional instrumentation.

- Partner Content -

Precision Control in Semiconductor Wafer Lapping

Vitrek’s application note details how MTI’s Accumeasure™ uses non-contact, push-pull capacitance probes for real-time, sub-micron thickness monitoring during semiconductor wafer lapping—even in electrically noisy, ungrounded environments. Automated alerts prevent over-thinning, improving yield consistency, precision, and process safety.

For more information, contact your local Aeroflex sales office by visiting or calling Aeroflex Sales at (800) 835-2352 [US], +44 (0)1438 742200 [UK] or info-test@aeroflex.com.

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