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A Dash of Maxwell’s: A Maxwell’s Equations Primer – Part 6: The Method of Moments

The Method of Moments has become one of the most powerful tools in the RF engineer’s arsenal. In this chapter, we make the transition from theory to practice, first by attempting to compute the characteristics of a “short dipole” by hand, and then by demonstrating that a computer can do that in just a few seconds.

 

Please view the Digital Edition to read “A Dash of Maxwell’s: A Maxwell’s Equations Primer – Part 6: The Method of Moments” (click here).

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Vitrek’s application note details how MTI’s Accumeasure™ uses non-contact, push-pull capacitance probes for real-time, sub-micron thickness monitoring during semiconductor wafer lapping—even in electrically noisy, ungrounded environments. Automated alerts prevent over-thinning, improving yield consistency, precision, and process safety.

 

 

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