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Ultra-Low Power Precision Operational Amplifiers

ON Semiconductor AmplifierON Semiconductor has introduced a family of affordable, precision CMOS operational amplifiers (op amps) that deliver zero drift operation and industry leading quiescent current for front-end amplifier circuits and power management designs. Targeted at industrial, white goods, telecom, wearables, Internet-of-Things (IoT), test equipment and instrumentation applications, the NCS325 and NCS333 op amp devices enhance the accuracy of motor control feedback and power supply control loops, thereby contributing to higher overall system efficiency.  These devices are complemented by the new NCV333automotive-qualified (AEC-Q100 grade 1) op amp offering similar functional performance for power train, braking, electronic power steering, valve controls, fuel pump and fuel injection system applications.

Featuring high DC precision parameters, such as the 10 micro Volts (µV) maximum input offset voltage at ambient temperature and the 30 nV/°C of offset temperature drift, make these amplifier devices extremely well optimized for low side current sensing and voltage differential measurement on front-end sensor functions. Minimal voltage variations over temperature along with close to zero offset ensure the efficiency of systems exposed to wide operating temperature ranges without the need for complex software calibration algorithms, resulting in a more manageable design and longer product lifespan.

The NCS325 and NCS333 provide rail-to-rail input and output performance and are optimized for low voltage operation of 1.8 volt (V) to 5.5 V, with a best in class quiescent currents of 21 µA and 17 µA respectively at 3.3 V. The devices operate with a gain bandwidth of 350 kilohertz (kHz) with ultra-low peak to peak noise down to 1.1 µV from 0.1 Hertz (Hz) to 10 Hz.

- Partner Content -

Shielding Effectiveness Test Guide

Just as interference testing requires RF enclosures, isolation systems in turn need their own testing. This document reviews some of the issues and considerations in testing RF enclosures.

For more information, visit http://www.onsemi.com.

 

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