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Related Articles:
- Dealing with EMI in Semiconductor Manufacturing: Part IIEnter SEMI E176-1017. It places the focus not on limited types of emission from any particular equipment, but on EMI in the overall manufacturing environment and in key locations where it specifically matters.
- Passive Filters Can Be Unconventionally SaturatedUsually HF filters are designed using inductors with cores. In this way a medium/high inductance value is obtained in small size components. But using cores has a limitation.
- Generalized Formula for the Calculation of a Probabilistic Metric for Random Hardware Failures in Redundant SystemsISO 26262 defines the probabilistic metric for random hardware failures (PMHF) as the average probability of a violation of a safety goal associated with a failure over a vehicle’s lifetime and architecture metrics. In this article, we propose a method to calculate the PMHF and expand the application to redundant subsystems that are not adequately described in the standard.
- Near-Field Shield Effectiveness Evaluation Using H-Field ProbeWe compare the shielding effectiveness of various solid metallic shields by direct H-field measurements in the near field of the source.
- SMPS Input Filter Design: Negative Resistance ApproachThis article discusses a practical approach to designing an input filter to the switch-mode power supply (SMPS).