The Impact of Tin Whisker Formation on Vehicle Electronics

Tin whiskers are small, hair-like structures that can form naturally from the surface of tin components. This article explores potential contributors to tin whisker growth, failure mechanisms that may be induced by whiskers, current testing standards and processes, and mitigation strategies, with a particular focus on the automotive industry.

Automate Your Automotive Cable/Harness Testing

This application note presents a highly functional, automated approach to automotive cable/harness testing. This combined approach results in an integrated solution that simplifies the testing process and enables unlimited data storage for analyses and backup.

Evolution and Analysis of EMC Specifications at a Major Automotive OEM

The history and insight into how the EMC specifications and procedures evolved at one automotive original equipment manufacturer (OEM). Other present-day OEM specifications are more similar than different mostly due to the extensive reference to international standards which these OEMs have taken part in developing (e.g., EMC committees). Knowing this history should help today’s EMC practitioners, especially those new to the discipline, gain some insight into the implementation and limitations of test procedures and when to be flexible in analyzing test results.